This instrument is an ultra-high-resolution scanning electron microscope capable of secondary-electron image resolution of 1.2 nm. It is fully digital and incorporates an image archiving computer.

In the world of nanotechnology, where structures are measured in billionths of a meter, precise imaging and measurement techniques are essential. Critical Dimension Scanning Electron Microscopy ...

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TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...

What is High-Resolution Transmission Electron Microscopy (HRTEM)? High-resolution transmission electron microscopy (HRTEM) is an advanced imaging technique that enables the direct visualization of ...

A comparison of experimental annular dark field (ADF)-scanning transmission electron microscopy (STEM) and electron ptychography in uncorrected and aberration-corrected electron microscopes. In the ...

With the inventions of transmission electron microscopy (TEM) in 1931 and scanning electron microscopy (SEM) shortly after in 1937, scientists gained an unprecedented ultrastructural view of the ...

Researchers at the University of Illinois at Urbana-Champaign have shown for the first time that expensive aberration-corrected microscopes are no longer required to achieve record-breaking ...

Electron microscopy has become a vital tool in structural biology, enabling researchers to visualize biological macromolecules at near-atomic resolution. Recent advances have transformed it from a low ...